Characterizing the Metal–SAM Interface in Tunneling Junctions
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CitationBowers, Carleen M., Kung-Ching Liao, Tomasz Zaba, Dmitrij Rappoport, Mostafa Baghbanzadeh, Benjamin Breiten, Anna Krzykawska, Piotr Cyganik, and George M. Whitesides. 2015. “Characterizing the Metal–SAM Interface in Tunneling Junctions.” ACS Nano 9 (2) (February 24): 1471–1477. doi:10.1021/nn5059216.
Abstracthis paper investigates the influence of the interface between a gold or silver metal electrode and an n-alkyl SAM (supported on that electrode) on the rate of charge transport across junctions with structure Met(Au or Ag)TS/A(CH2)nH//Ga2O3/EGaIn by comparing measurements of current density, J(V), for Met/AR = Au/thiolate (Au/SR), Ag/thiolate (Ag/SR), Ag/carboxylate (Ag/O2CR), and Au/acetylene (Au/C≡CR), where R is an n-alkyl group. Values of J0 and β (from the Simmons equation) were indistinguishable for these four interfaces. Since the anchoring groups, A, have large differences in their physical and electronic properties, the observation that they are indistinguishable in their influence on the injection current, J0 (V = 0.5) indicates that these four Met/A interfaces do not contribute to the shape of the tunneling barrier in a way that influences J(V).
Citable link to this pagehttp://nrs.harvard.edu/urn-3:HUL.InstRepos:24981607
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