Traction microscopy to identify force modulation in sub-resolution adhesions

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Traction microscopy to identify force modulation in sub-resolution adhesions

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Title: Traction microscopy to identify force modulation in sub-resolution adhesions
Author: Han, Sangyoon J.; Oak, Youbean; Groisman, Alex; Danuser, Gaudenz

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Citation: Han, Sangyoon J., Youbean Oak, Alex Groisman, and Gaudenz Danuser. 2015. “Traction microscopy to identify force modulation in sub-resolution adhesions.” Nature methods 12 (7): 653-656. doi:10.1038/nmeth.3430. http://dx.doi.org/10.1038/nmeth.3430.
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Abstract: We present a reconstruction algorithm that resolves cellular tractions in diffraction-limited nascent adhesions (NAs). The enabling method is the introduction of sparsity regularization to the solution of the inverse problem, which suppresses noise without underestimating traction magnitude. We show that NAs transmit a distinguishable amount of traction and that NA maturation depends on traction growth rate. A software package implementing this numerical approach is provided.
Published Version: doi:10.1038/nmeth.3430
Other Sources: http://www.ncbi.nlm.nih.gov/pmc/articles/PMC4490115/pdf/
Terms of Use: This article is made available under the terms and conditions applicable to Other Posted Material, as set forth at http://nrs.harvard.edu/urn-3:HUL.InstRepos:dash.current.terms-of-use#LAA
Citable link to this page: http://nrs.harvard.edu/urn-3:HUL.InstRepos:24983853
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