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dc.contributor.authorKlein, Mason Joseph
dc.contributor.authorHohensee
dc.contributor.authorPhillips, David F.
dc.contributor.authorWalsworth, Ronald Lee
dc.date.accessioned2016-04-11T18:33:58Z
dc.date.issued2011
dc.identifier.citationKlein, M., M. Hohensee, D. F. Phillips, and R. L. Walsworth. 2011. “Electromagnetically Induced Transparency in Paraffin-Coated Vapor Cells.” Physical Review A 83 (1) (January 31). doi:10.1103/physreva.83.013826.en_US
dc.identifier.issn1050-2947en_US
dc.identifier.urihttp://nrs.harvard.edu/urn-3:HUL.InstRepos:26514371
dc.description.abstractAntirelaxation coatings in atomic vapor cells allow ground-state coherent spin states to survive many collisions with the cell walls. This reduction in the ground-state decoherence rate gives rise to ultranarrow-bandwidth features in electromagnetically induced transparency (EIT) spectra, which can form the basis of, for example, long-time scale slow and stored light, sensitive magnetometers, and precise frequency standards. Here we study, both experimentally and theoretically, how Zeeman EIT contrast and width in paraffin-coated rubidium vapor cells are determined by cell and laser-beam geometry, laser intensity, and atomic density. Using a picture of Ramsey pulse sequences, where atoms alternately spend “bright” and “dark” time intervals inside and outside the laser beam, we explain the behavior of EIT features in coated cells, highlighting their unique characteristics and potential applications.en_US
dc.description.sponsorshipPhysicsen_US
dc.language.isoen_USen_US
dc.publisherAmerican Physical Society (APS)en_US
dc.relation.isversionofdoi:10.1103/PhysRevA.83.013826en_US
dash.licenseLAA
dc.titleElectromagnetically induced transparency in paraffin-coated vapor cellsen_US
dc.typeJournal Articleen_US
dc.description.versionVersion of Recorden_US
dc.relation.journalPhys. Rev. Aen_US
dash.depositing.authorWalsworth, Ronald Lee
dc.date.available2016-04-11T18:33:58Z
dc.identifier.doi10.1103/PhysRevA.83.013826*
dash.contributor.affiliatedKlein, Mason
dash.contributor.affiliatedPhillips, David
dash.contributor.affiliatedWalsworth, Ronald


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