A capacitance-based micropositioning system for x-ray rocking curve measurements
Miller, G. L.
Boie, R. A.
Cowan, P. L.
Kerr, R. W.
Robinson, D. A. H.
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CitationMiller, G. L., R. A. Boie, P. L. Cowan, J. A. Golovchenko, R. W. Kerr, and D. A. H. Robinson. 1979. A Capacitance-Based Micropositioning System for x-Ray Rocking Curve Measurements. Review of Scientific Instruments 50, no, 9: 1062-1069. doi:10.1063/1.1136010.
AbstractCertain types of x‐ray experiments require very precise angular positioning of crystals in the vicinity of the Bragg reflection condition. A system applicable to some measurement of this type is described which achieves a long‐term angular stability of ∼10−7 radians, coupled with a linear angular readout. This is achieved through a novel capacitance sensing system which provides angle measurement, together with the use of an auxilliary servo loop based on the Bragg condition to ensure long‐term overall angular stability.
Citable link to this pagehttp://nrs.harvard.edu/urn-3:HUL.InstRepos:29407060
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