A capacitance-based micropositioning system for x-ray rocking curve measurements
Author
Miller, G. L.
Boie, R. A.
Cowan, P. L.
Kerr, R. W.
Robinson, D. A. H.
Published Version
https://doi.org/10.1063/1.1136010Metadata
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Miller, G. L., R. A. Boie, P. L. Cowan, J. A. Golovchenko, R. W. Kerr, and D. A. H. Robinson. 1979. A Capacitance-Based Micropositioning System for x-Ray Rocking Curve Measurements. Review of Scientific Instruments 50, no, 9: 1062-1069. doi:10.1063/1.1136010.Abstract
Certain types of x‐ray experiments require very precise angular positioning of crystals in the vicinity of the Bragg reflection condition. A system applicable to some measurement of this type is described which achieves a long‐term angular stability of ∼10−7 radians, coupled with a linear angular readout. This is achieved through a novel capacitance sensing system which provides angle measurement, together with the use of an auxilliary servo loop based on the Bragg condition to ensure long‐term overall angular stability.Terms of Use
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http://nrs.harvard.edu/urn-3:HUL.InstRepos:29407060
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