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dc.contributor.authorMiller, G. L.
dc.contributor.authorBoie, R. A.
dc.contributor.authorCowan, P. L.
dc.contributor.authorGolovchenko, Jene Andrew
dc.contributor.authorKerr, R. W.
dc.contributor.authorRobinson, D. A. H.
dc.date.accessioned2016-11-18T17:28:15Z
dc.date.issued1979
dc.identifier.citationMiller, G. L., R. A. Boie, P. L. Cowan, J. A. Golovchenko, R. W. Kerr, and D. A. H. Robinson. 1979. A Capacitance-Based Micropositioning System for x-Ray Rocking Curve Measurements. Review of Scientific Instruments 50, no, 9: 1062-1069. doi:10.1063/1.1136010.en_US
dc.identifier.issn0034-6748en_US
dc.identifier.urihttp://nrs.harvard.edu/urn-3:HUL.InstRepos:29407060
dc.description.abstractCertain types of x‐ray experiments require very precise angular positioning of crystals in the vicinity of the Bragg reflection condition. A system applicable to some measurement of this type is described which achieves a long‐term angular stability of ∼10−7 radians, coupled with a linear angular readout. This is achieved through a novel capacitance sensing system which provides angle measurement, together with the use of an auxilliary servo loop based on the Bragg condition to ensure long‐term overall angular stability.en_US
dc.description.sponsorshipPhysicsen_US
dc.language.isoen_USen_US
dc.publisherAIP Publishingen_US
dc.relation.isversionofdoi:10.1063/1.1136010en_US
dc.relation.hasversionhttp://golovchenko.physics.harvard.edu/ACapacitanceBasedMicropositioning.pdfen_US
dash.licenseLAA
dc.subjectcapacitanceen_US
dc.subjectservomechanismsen_US
dc.titleA capacitance-based micropositioning system for x-ray rocking curve measurementsen_US
dc.typeJournal Articleen_US
dc.description.versionVersion of Recorden_US
dc.relation.journalRev. Sci. Instrum.en_US
dash.depositing.authorGolovchenko, Jene Andrew
dc.date.available2016-11-18T17:28:15Z
dc.identifier.doi10.1063/1.1136010*
dash.contributor.affiliatedGolovchenko, Jene


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