Janapa Reddi, Vijay, Svilen Kanev, Wonyoung Kim, Simone Campanoni, Michael D. Smith, Gu-Yeon Wei, and David Brooks. 2011. “Voltage Noise in Production Processors.” IEEE Micro 31 (1) (January): 20–28. doi:10.1109/mm.2010.104.
Voltage variations are a major challenge in processor design. Here, researchers characterize the voltage noise characteristics of programs as they run to completion on a production Core 2 Duo processor. Furthermore, they characterize the implications of resilient architecture design for voltage variation in future systems.