Show simple item record

dc.contributor.authorJanapa Reddi, Vijay
dc.contributor.authorKanev, Svilen
dc.contributor.authorKim, Wonyoung
dc.contributor.authorCampanoni, Simone
dc.contributor.authorSmith, Michael D.
dc.contributor.authorWei, Gu-Yeon
dc.contributor.authorBrooks, David M.
dc.date.accessioned2018-01-24T18:32:22Z
dc.date.issued2011
dc.identifier.citationJanapa Reddi, Vijay, Svilen Kanev, Wonyoung Kim, Simone Campanoni, Michael D. Smith, Gu-Yeon Wei, and David Brooks. 2011. “Voltage Noise in Production Processors.” IEEE Micro 31 (1) (January): 20–28. doi:10.1109/mm.2010.104.en_US
dc.identifier.issn0272-1732en_US
dc.identifier.urihttp://nrs.harvard.edu/urn-3:HUL.InstRepos:34729252
dc.description.abstractVoltage variations are a major challenge in processor design. Here, researchers characterize the voltage noise characteristics of programs as they run to completion on a production Core 2 Duo processor. Furthermore, they characterize the implications of resilient architecture design for voltage variation in future systems.en_US
dc.description.sponsorshipEngineering and Applied Sciencesen_US
dc.language.isoen_USen_US
dc.publisherInstitute of Electrical & Electronics Engineers (IEEE)en_US
dc.relation.isversionofdoi:10.1109/MM.2010.104en_US
dash.licenseMETA_ONLY
dc.titleVoltage Noise in Production Processorsen_US
dc.typeJournal Articleen_US
dc.description.versionVersion of Recorden_US
dc.relation.journalIEEE Microen_US
dash.depositing.authorSmith, Michael D.
dash.embargo.until10000-01-01
dc.identifier.doi10.1109/MM.2010.104*
workflow.legacycommentsoap.needman (MM)en_US
dash.contributor.affiliatedKim, Wonyoung
dash.contributor.affiliatedCampanoni, Simone
dash.contributor.affiliatedKanev, Svilen
dash.contributor.affiliatedBrooks, David
dash.contributor.affiliatedWei, Gu-Yeon
dash.contributor.affiliatedSmith, Michael


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record