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dc.contributor.authorMatusik, Wojciech
dc.contributor.authorPfister, Hanspeter
dc.contributor.authorBrand, Matt
dc.contributor.authorMcMillan, Leonard
dc.date.accessioned2010-05-26T13:52:16Z
dc.date.issued2003
dc.identifier.citationMatusik, Wojciech, Hanspeter Pfister, Matt Brand, and Leonard McMillan. 2003. A data-driven reflectance model. In Proceedings International Conference on Computer Graphics and Interactive Techniques, ACM SIGGRAPH 2003 Papers: July 27-31, 2003, San Diego, California, 759-769. New York, N.Y.: ACM Press. Also published in ACM Transactions on Graphics 22(3): 759-769.en_US
dc.identifier.isbn1-58113-709-5en_US
dc.identifier.issn0730-0301en_US
dc.identifier.urihttp://nrs.harvard.edu/urn-3:HUL.InstRepos:4135447
dc.description.abstractWe present a generative model for isotropic bidirectional reflectance distribution functions (BRDFs) based on acquired reflectance data. Instead of using analytical reflectance models, we represent each BRDF as a dense set of measurements. This allows us to interpolate and extrapolate in the space of acquired BRDFs to create new BRDFs. We treat each acquired BRDF as a single high-dimensional vector taken from a space of all possible BRDFs. We apply both linear (subspace) and non-linear (manifold) dimensionality reduction tools in an effort to discover a lower-dimensional representation that characterizes our measurements. We let users define perceptually meaningful parametrization directions to navigate in the reduced-dimension BRDF space. On the low-dimensional manifold, movement along these directions produces novel but valid BRDFs.en_US
dc.description.sponsorshipEngineering and Applied Sciencesen_US
dc.language.isoen_USen_US
dc.publisherAssociation for Computing Machineryen_US
dc.relation.isversionofdoi:10.1145/882262.882343en_US
dc.relation.isversionofdoi:10.1145/1201775.882343en_US
dc.relation.hasversionhttp://gvi.seas.harvard.edu/sites/all/files/SIG2003_0.pdfen_US
dash.licenseLAA
dc.subjectBRDFen_US
dc.subjectimage-based modelingen_US
dc.subjectlight reflection modelsen_US
dc.subjectphotometric measurementsen_US
dc.subjectreflectanceen_US
dc.titleA Data-Driven Reflectance Modelen_US
dc.typeConference Paperen_US
dc.description.versionAccepted Manuscripten_US
dc.relation.journalACM Transactions on Graphicsen_US
dash.depositing.authorPfister, Hanspeter
dc.date.available2010-05-26T13:52:16Z
dc.identifier.doi10.1145/882262.882343*
dash.contributor.affiliatedPfister, Hanspeter


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