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dc.contributor.authorZhang, Shuyan
dc.contributor.authorKats, Mikhail A.
dc.contributor.authorCui, Yanjie
dc.contributor.authorZhou, You
dc.contributor.authorYao, Yu
dc.contributor.authorRamanathan, Shriram
dc.contributor.authorCapasso, Federico
dc.date.accessioned2019-09-17T13:47:30Z
dc.date.issued2014
dc.identifier.citationZhang, Shuyan, Mikhail A. Kats, Yanjie Cui, You Zhou, Yu Yao, Shriram Ramanathan, and Federico Capasso. 2014. “Current-Modulated Optical Properties of Vanadium Dioxide Thin Films in the Phase Transition Region.” Applied Physics Letters 105 (21): 211104. https://doi.org/10.1063/1.4902924.
dc.identifier.issn0003-6951
dc.identifier.issn1077-3118
dc.identifier.issn1520-8842
dc.identifier.urihttp://nrs.harvard.edu/urn-3:HUL.InstRepos:41371713*
dc.description.abstractVanadium dioxide (VO2) is a correlated electron material which undergoes an insulator-metal transition proximal to room temperature. The large change of optical properties across this phase transition is promising for tunable optical and optoelectronic devices especially at infrared frequencies. We demonstrate the ability to locally tune the optical properties on the micron scale through a simple design consisting of two electrodes patterned on a VO2 thin film. By current injection between the electrodes, a localized conducting path (metallic phase) can be formed within the insulating background. The width of the conducting path can be controlled by varying the applied current. Fourier transform infrared imaging shows that this current-modulated reflectance changes significantly over a distance on the order of the wavelength in the mid-infrared spectral range.
dc.language.isoen_US
dc.publisherAIP Publishing
dash.licenseLAA
dc.titleCurrent-modulated optical properties of vanadium dioxide thin films in the phase transition region
dc.typeJournal Article
dc.description.versionVersion of Record
dc.relation.journalApplied Physics Letters
dash.depositing.authorCapasso, Federico::c84ca12d0f20adc982c7c314bebd7c9e::600
dc.date.available2019-09-17T13:47:30Z
dash.workflow.comments1Science Serial ID 8605
dc.identifier.doi10.1063/1.4902924
dash.source.volume105;21
dash.source.page211104


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