Coaxial Atomic Force Microscope Tweezers

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Coaxial Atomic Force Microscope Tweezers

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Title: Coaxial Atomic Force Microscope Tweezers
Author: Brown, Keith Andrew; Aguilar, J.A.; Westervelt, Robert M.

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Citation: Brown, Keith A., J.A. Aguilar, and Robert M. Westervelt. 2010. Coaxial atomic force microscope tweezers. Applied Physics Letters 96(123109).
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Abstract: We demonstrate coaxial atomic force microscope (AFM) tweezers that can trap and place small objects using dielectrophoresis (DEP). An attractive force is generated at the tip of a coaxial AFM probe by applying a radio frequency voltage between the center conductor and a grounded shield; the origin of the force is found to be DEP by measuring the pull-off force versus applied voltage. We show that the coaxial AFM tweezers can perform three-dimensional assembly by picking up a specified silica microsphere, imaging with the microsphere at the end of the tip, and placing it at a target destination.
Published Version: doi:10.1063/1.3372621
Terms of Use: This article is made available under the terms and conditions applicable to Open Access Policy Articles, as set forth at http://nrs.harvard.edu/urn-3:HUL.InstRepos:dash.current.terms-of-use#OAP
Citable link to this page: http://nrs.harvard.edu/urn-3:HUL.InstRepos:4142553
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