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dc.contributor.authorBrown, Keith Andrew
dc.contributor.authorAguilar, J.A.
dc.contributor.authorWestervelt, Robert M.
dc.date.accessioned2010-06-02T16:59:14Z
dc.date.issued2010
dc.identifier.citationBrown, Keith A., J.A. Aguilar, and Robert M. Westervelt. 2010. Coaxial atomic force microscope tweezers. Applied Physics Letters 96(123109).en_US
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://nrs.harvard.edu/urn-3:HUL.InstRepos:4142553
dc.description.abstractWe demonstrate coaxial atomic force microscope (AFM) tweezers that can trap and place small objects using dielectrophoresis (DEP). An attractive force is generated at the tip of a coaxial AFM probe by applying a radio frequency voltage between the center conductor and a grounded shield; the origin of the force is found to be DEP by measuring the pull-off force versus applied voltage. We show that the coaxial AFM tweezers can perform three-dimensional assembly by picking up a specified silica microsphere, imaging with the microsphere at the end of the tip, and placing it at a target destination.en_US
dc.description.sponsorshipEngineering and Applied Sciencesen_US
dc.language.isoen_USen_US
dc.publisherAmerican Institute of Physicsen_US
dc.relation.isversionofdoi:10.1063/1.3372621en_US
dash.licenseOAP
dc.titleCoaxial Atomic Force Microscope Tweezersen_US
dc.typeJournal Articleen_US
dc.description.versionAccepted Manuscripten_US
dc.relation.journalApplied Physics Lettersen_US
dash.depositing.authorWestervelt, Robert M.
dc.date.available2010-06-02T16:59:14Z
dc.identifier.doi10.1063/1.3372621*
dash.contributor.affiliatedWestervelt, Robert
dash.contributor.affiliatedBrown, Keith Andrew


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