X-ray Reflectivity Study of Temperature-Dependent Surface Layering in Liquid Hg
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Ocko, B. M.
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CitationDiMasi, E., H. Tostmann, B. M. Ocko, Peter S. Pershan, and M. Deutsch. 1998. X-ray reflectivity study of temperature-dependent surface layering in liquid Hg. Physical Review B 58(20): R13419–R13422.
AbstractWe report x-ray reflectivity measurements of liquid mercury between -36 °C and +25 °C. The surface structure can be described by a layered density profile convolved with a thermal roughness σT. The layering has a spacing of 2.72 Å and an exponential decay length of 5.0 Å. Surprisingly, σT is found to increase considerably faster with temperature than the √T behavior predicted by capillary wave theory, in contrast with previous measurements on Ga and dielectric liquids.
Citable link to this pagehttp://nrs.harvard.edu/urn-3:HUL.InstRepos:4419624
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