X-Ray Reflectivity Studies of a Microemulsion Surface

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X-Ray Reflectivity Studies of a Microemulsion Surface

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Title: X-Ray Reflectivity Studies of a Microemulsion Surface
Author: Schwartz, D. K.; Braslau, A.; Ocko, B.; Pershan, Peter S.; Als-Nielsen, J.; Huang, J. S.

Note: Order does not necessarily reflect citation order of authors.

Citation: Schwartz, D. K., A. Braslau, B. Ocko, Peter S. Pershan, J. Als-Nielsen, and J. S. Huang. 1988. X-ray reflectivity studies of a microemulsion surface. Physical Review A 38(11): 5817-5824.
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Abstract: The surface structure of the AOT (sodium di-2-ethylsulfosuccinate) microemulsion system with equal volume fractions of D2O and decane, for AOT volume fractions of 0.42, 0.305, and 0.181, has been studied by a combination of x-ray specular reflectivity and scattering from the bulk. Scattering from the bulk material below the surface is consistent with Kotlarchyk’s interpretation of densely packed spherical micelles. Specular reflectivity from the surface implies a surface electron-density profile consistent with one to two layers of microemulsion droplets. The size of and distance between droplets is consistent with the respective values for the droplets in the bulk phase.
Published Version: doi:10.1103/PhysRevA.38.5817
Terms of Use: This article is made available under the terms and conditions applicable to Other Posted Material, as set forth at http://nrs.harvard.edu/urn-3:HUL.InstRepos:dash.current.terms-of-use#LAA
Citable link to this page: http://nrs.harvard.edu/urn-3:HUL.InstRepos:8609121
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