Triaxial AFM Probes for Noncontact Trapping and Manipulation

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Triaxial AFM Probes for Noncontact Trapping and Manipulation

Show simple item record Brown, Keith A. Westervelt, Robert M. 2012-08-23T12:44:52Z 2011
dc.identifier.citation Brown, Keith A., and Robert M. Westervelt. 2011. Triaxial AFM probes for noncontact trapping and manipulation. Nano Letters 11(8): 3197–3201. en_US
dc.identifier.issn 1530-6984 en_US
dc.identifier.issn 1530-6992 en_US
dc.description.abstract We show that a triaxial atomic force microscopy probe creates a noncontact trap for a single particle in a fluid via negative dielectrophoresis. A zero in the electric field profile traps the particle above the probe surface, avoiding adhesion, and the repulsive region surrounding the zero pushes other particles away, preventing clustering. Triaxial probes are promising for three-dimensional assembly and for selective imaging of a particular property of a sample using interchangeable functionalized particles. en_US
dc.description.sponsorship Engineering and Applied Sciences en_US
dc.language.iso en_US en_US
dc.publisher American Chemical Society en_US
dc.relation.isversionof doi:10.1021/nl201434t en_US
dc.relation.hasversion en_US
dash.license OAP
dc.subject dielectrophoresis en_US
dc.subject noncontact trapping en_US
dc.subject AFM en_US
dc.subject assembly en_US
dc.subject nanoparticles en_US
dc.subject triaxial en_US
dc.title Triaxial AFM Probes for Noncontact Trapping and Manipulation en_US
dc.type Journal Article en_US
dc.description.version Author's Original en_US
dc.relation.journal Nano Letters en_US Westervelt, Robert M. 2012-08-23T12:44:52Z

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