High Spatial Resolution Kelvin Probe Force Microscopy With Coaxial Probes
Brown, Keith A.
Satziner, Kevin J.
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CitationBrown, Keith A., Kevin J. Satziner, and Robert M. Westervelt. 2012. High spatial resolution Kelvin probe force microscopy with coaxial probes. Nanotechnology 23(11): 115703.
AbstractKelvin probe force microscopy (KPFM) is a widely used technique to measure the local contact potential difference (CPD) between an AFM probe and the sample surface via the electrostatic force. The spatial resolution of KPFM is intrinsically limited by the long range of the electrostatic interaction, which includes contributions from the macroscopic cantilever and the conical tip. Here, we present coaxial AFM probes in which the cantilever and cone are shielded by a conducting shell, confining the tip-sample electrostatic interaction to a small region near the end of the tip. We have developed a technique to measure the true CPD despite the presence of the shell electrode. We find the behavior of these probes agrees with an electrostatic model of the force, and we observe a factor of 5 improvement in spatial resolution relative to unshielded probes. Our discussion centers on KPFM, but the field confinement offered by these probes may improve any variant of electrostatic force microscopy.
Citable link to this pagehttp://nrs.harvard.edu/urn-3:HUL.InstRepos:9639955
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