Show simple item record

dc.contributor.authorBrown, Keith A.
dc.contributor.authorSatziner, Kevin J.
dc.contributor.authorWestervelt, Robert M.
dc.date.accessioned2012-09-25T18:26:37Z
dc.date.issued2012
dc.identifier.citationBrown, Keith A., Kevin J. Satziner, and Robert M. Westervelt. 2012. High spatial resolution Kelvin probe force microscopy with coaxial probes. Nanotechnology 23(11): 115703.en_US
dc.identifier.issn0957-4484en_US
dc.identifier.urihttp://nrs.harvard.edu/urn-3:HUL.InstRepos:9639955
dc.description.abstractKelvin probe force microscopy (KPFM) is a widely used technique to measure the local contact potential difference (CPD) between an AFM probe and the sample surface via the electrostatic force. The spatial resolution of KPFM is intrinsically limited by the long range of the electrostatic interaction, which includes contributions from the macroscopic cantilever and the conical tip. Here, we present coaxial AFM probes in which the cantilever and cone are shielded by a conducting shell, confining the tip-sample electrostatic interaction to a small region near the end of the tip. We have developed a technique to measure the true CPD despite the presence of the shell electrode. We find the behavior of these probes agrees with an electrostatic model of the force, and we observe a factor of 5 improvement in spatial resolution relative to unshielded probes. Our discussion centers on KPFM, but the field confinement offered by these probes may improve any variant of electrostatic force microscopy.en_US
dc.description.sponsorshipEngineering and Applied Sciencesen_US
dc.language.isoen_USen_US
dc.publisherInstitute of Physicsen_US
dc.relation.isversionofdoi:10.1088/0957-4484/23/11/115703en_US
dash.licenseOAP
dc.subjectacceleratorsen_US
dc.subjectbeams and electromagnetismen_US
dc.subjectinstrumentation and measurementen_US
dc.subjectsurfaces, interfaces, and thin filmsen_US
dc.titleHigh Spatial Resolution Kelvin Probe Force Microscopy With Coaxial Probesen_US
dc.typeJournal Articleen_US
dc.description.versionAccepted Manuscripten_US
dc.relation.journalNanotechnologyen_US
dash.depositing.authorWestervelt, Robert M.
dc.date.available2012-09-25T18:26:37Z
dc.identifier.doi10.1088/0957-4484/23/11/115703*
dash.contributor.affiliatedWestervelt, Robert


Files in this item

Thumbnail
Thumbnail

This item appears in the following Collection(s)

Show simple item record