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dc.contributor.authorHuang, Jiangshui
dc.contributor.authorShian, Samuel
dc.contributor.authorDiebold, Roger Mitchell
dc.contributor.authorSuo, Zhigang
dc.contributor.authorClarke, David R.
dc.date.accessioned2012-11-08T18:06:54Z
dc.date.issued2012
dc.identifier.citationHuang, Jiangshui, Samuel Shian, Roger M. Diebold, Zhigang Suo, and David R. Clarke. 2012. The thickness and stretch dependence of the electrical breakdown strength of an acrylic dielectric elastomer. Applied Physics Letters 101:122905.en_US
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://nrs.harvard.edu/urn-3:HUL.InstRepos:9887625
dc.description.abstractThe performance of dielectric elastomer actuators is limited by electrical breakdown. Attempts to measure this are confounded by the voltage-induced thinning of the elastomer. A test configuration is introduced that avoids this problem: A thin sheet of elastomer is stretched, crossed-wire electrodes are attached, and then embedded in a stiff polymer. The applied electric field at breakdown, \(E_{B}\), is found to depend on both the deformed thickness, h, and the stretch applied, \(\lambda\). For the acrylic elastomer investigated, the breakdown field scales as \(E_{B}\)  =  51  h\(^{ − 0.25 }\) \(\lambda\)\(^{0.63}\). The test configuration allows multiple individual tests to be made on the same sheet of elastomer.en_US
dc.description.sponsorshipEngineering and Applied Sciencesen_US
dc.language.isoen_USen_US
dc.publisherAmerican Institute of Physicsen_US
dc.relation.isversionofdoi:10.1063/1.4754549en_US
dash.licenseOAP
dc.subjectdielectric elastomersen_US
dc.subjectdielectric strengthen_US
dc.subjectelectric breakdownen_US
dc.subjectdielectric thinningen_US
dc.titleThe Thickness and Stretch Dependence of the Electrical Breakdown Strength of an Acrylic Dielectric Elastomeren_US
dc.typeJournal Articleen_US
dc.description.versionAccepted Manuscripten_US
dc.relation.journalApplied Physics Lettersen_US
dash.depositing.authorClarke, David R.
dc.date.available2012-11-08T18:06:54Z
dc.identifier.doi10.1063/1.4754549*
dash.contributor.affiliatedDiebold, Roger Mitchell
dash.contributor.affiliatedShian, Samuel
dash.contributor.affiliatedHuang, Jiangshui
dash.contributor.affiliatedClarke, David
dash.contributor.affiliatedSuo, Zhigang
dc.identifier.orcid0000-0002-4068-4844


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