Tewari, GeetikaSnyder, JohnSander, Pedro V.Gortler, StevenHoppe, Hugues2009-03-032004Tewari, Geetika, John Snyder, Pedro V. Sander, Steven J. Gortler, and Hugues Hoppe. 2004. Signal-specialized parameterization for piecewise linear reconstruction. In Proceedings of the 2004 Eurographics/ACM SIGGRAPH symposium on geometry processing (SGP 2004), July 8-10, 2004, Nice, France, ed. SGP, 55-64. Aire-la-Ville, Switzerland: Eurographics Association. Also published as ACM International Conference Proceeding Series 71: 55-64.1727-8384http://nrs.harvard.edu/urn-3:HUL.InstRepos:2641680We propose a metric for surface parameterization specialized to its signal that can be used to create more efficient, high-quality texture maps. Derived from Taylor expansion of signal error, our metric predicts the signal approximation error - the difference between the original surface signal and its reconstruction from the sampled texture. Unlike previous methods, our metric assumes piecewise-linear reconstruction, and thus makes a good approximation to bilinear reconstruction employed in graphics hardware. We achieve significant savings in texture area for a desired signal accuracy compared to the signal-specialized parameterization metric proposed by Sander et al. in the 2002 Eurographics Workshop on Rendering.en-UScomputer graphics10.1145/1057432.1057440