Sanders, Paul G.Aziz, Michael2009-04-152001Sanders, Paul G. and Michael J. Aziz. 2001. In Proceedings of the Microgravity Materials Science Conference 2000, June 6-8, 2000, Huntsville, Alabama, ed. NASA Microgravity Materials Science Conference and Narayanan Ramachandran. Washington, D.C.: NASA.http://nrs.harvard.edu/urn-3:HUL.InstRepos:2795721Laterally homogeneous pulsed melting of thin films is being investigated as a way to eliminate convection and thereby determine diffusivities in refractory mels under terrestrial conditions, providing comparison data for microgravity measurements. The silicon liquid self-diffusivity was determined by pulsed laser melting for <sup>30</sup>Si<sup>+</sup> experimental concentration spatial profile given the initial concentration profile and the temporal melt-depth profile. The silicon liquid self-diffusivity at the melting point (4.0 plus or minus 0.5) X 10<sup>-4</sup>cm<sup>2</sup>/s. Calculations of Buoyancy and Marangoni convection indicate that convective contamination is unlikely.en-USTerrestrial Measurements of Diffusivities in Refractory Melts by Pulsed Melting of Thin Films