Sanders, P. G.Thompson, Michael O.Renk, Tim J.Aziz, Michael2009-04-202000Sanders, P. G., Michael O. Thompson, Tim J. Renk, and Michael J. Aziz. 2000. Liquid titanium solute diffusion measured by pulsed ion-beam melting. Metallurgical and Materials Transactions A 32(12): 2969-2974.1073-5623http://nrs.harvard.edu/urn-3:HUL.InstRepos:2797298The diffusivities of Sri, Mo, Zr, and Hf in liquid Ti were determined by pulsed ion-beam melting of thin liquid layers. Time-resolved optical reflectance and one-dimensional heat-flow simulations were employed to determine the melt duration. The broadening of nearly Gaussian solute concentration-depth profiles was determined ex situ using Rutherford backscattering spectrometry. Solute diffusivities in the range of 5 to 9 X 10<sup>-5</sup> cm<sup>2</sup>/s were determined at temperatures in the range of 2200 to 2500 K. Calculations of buoyancy and Marangoni convection indicate that convective contamination is unlikely.en-USLiquid Titanium Solute Diffusion Measured by Pulsed Ion-Beam Melting10.1007/s11661-001-0171-1