Tsao, Jeff Y.Aziz, MichaelPeercy, Paul S.Thompson, Michael O.2009-05-111988Jeff Y. Tsao, Michael J. Aziz, Paul S. Peercy, Michael O. Thompson. 1988. Interface velocity transients during melting of a-Si/c-Si thin films. Materials Research Society Symposia Proceedings 100: 519-524.0272-9172http://nrs.harvard.edu/urn-3:HUL.InstRepos:2913134The authors report transient conductance measurement of liquid/solid interface velocities during pulsed laser melting of amorphous Si (a-Si) films on crystalline Si (c-Si), and a more accurate, systematic procedure for analyzing these measurements than described in previous work. From these analyses are extracted relations between the melting velocities of a-Si and c-Si at a given interface temperature, and between the temperatures during steady-state melting of a-Si and c-Si at a given interface velocity.en-US10.1557/PROC-100-519