Brown, Keith AndrewAguilar, J.A.Westervelt, Robert2010-06-022010Brown, Keith A., J.A. Aguilar, and Robert M. Westervelt. 2010. Coaxial atomic force microscope tweezers. Applied Physics Letters 96(123109).0003-6951http://nrs.harvard.edu/urn-3:HUL.InstRepos:4142553We demonstrate coaxial atomic force microscope (AFM) tweezers that can trap and place small objects using dielectrophoresis (DEP). An attractive force is generated at the tip of a coaxial AFM probe by applying a radio frequency voltage between the center conductor and a grounded shield; the origin of the force is found to be DEP by measuring the pull-off force versus applied voltage. We show that the coaxial AFM tweezers can perform three-dimensional assembly by picking up a specified silica microsphere, imaging with the microsphere at the end of the tip, and placing it at a target destination.en-USJournal Article2010-06-0210.1063/1.3372621