Regan, M. J.Pershan, PeterMagnussen, O. M.Ocko, B. M.Deutsch, M.Berman, L. E.2013-02-281996Regan, M. J., Peter S. Pershan, O. M. Magnussen, B. M. Ocko, M. Deutsch, and L. E. Berman. 1996. Capillary-wave roughening of surface-induced layering in liquid gallium. Physical Review B 54(14): 9730-9733.1098-0121http://nrs.harvard.edu/urn-3:HUL.InstRepos:10356601The temperature dependence of surface-induced atomic layering in liquid gallium has been investigated with x-ray reflectivity. The prominent layering peak at \(q_z\)=2.4 Å\(^{-1}\) decreases dramatically upon heating from 22 to 170\(^\circ\)C, but its width stays, unexpectedly, unchanged. The decrease is traced to the temperature dependence of capillary-wave induced surface roughness. The constant width indicates a temperature-independent layering decay length. The measured layering amplitudes are found to be significantly underestimated by existing theory and molecular simulations.en-USJournal Article10.1103/PhysRevB.54.9730