Braslau, A.Deutsch, M.Pershan, PeterWeiss, A. H.Als-Nielsen, J.Bohr, J.2013-03-011985Braslau, A., M. Deutsch, Peter S. Pershan, A. H. Weiss, J. Als-Nielsen, and J. Bohr. 1985. Surface roughness of water measured by x-ray reflectivity. Physical Review Letters 54(2): 114-117.0031-90071079-7114http://nrs.harvard.edu/urn-3:HUL.InstRepos:10358893The roughness of the liquid-vapor interface for pure water was measured by a technique of x-ray reflectivity. With synchrotron radiation \((\lambda \sim1.5 \mathring{A})\), the angular dependence of the x-ray reflectivity was measured from grazing incidence \((\sim 0.0021 rad)\), where the reflectivity was greater than 0.96, to an incident angle of \(\sim 0.05 rad\), where the reflectivity was \(\sim 7×10^{-8}\). A fit to the data by a theory with only one adjustable parameter obtains \(3.2 \mathring{A}\) for the root-mean-square roughness of the water surface.en-USJournal Article2013-03-0110.1103/PhysRevLett.54.114