Pershan, Peter2013-03-011996Pershan, Peter S. 1996. Liquid surface order: X-ray reflectivity. Physica A: Statistical and Theoretical Physics 231(1-3): 111-116.0378-4371http://nrs.harvard.edu/urn-3:HUL.InstRepos:10357481This note contains a brief summary of how the X-ray specular reflectivity technique can be used to measure electron density profiles across the bulk/vapor interface for a variety of liquids.en-USJournal Article10.1016/0378-4371(95)00456-4