Regan, M. J.Kawamoto, E. H.Lee, S.Pershan, PeterMaskil, N.Deutsch, M.Magnussen, O. M.Ocko, B. M.Berman, L. E.2013-03-011995Regan, M. J., E. H. Kawamoto, S. Lee, and Peter S. Pershan, N. Maskil, M. Deutsch, O. M. Magnussen, B. M. Ocko, and L. E. Berman. 1995. Surface layering in liquid gallium: An x-ray reflectivity study. Physical Review Letters 75(13): 2498–2501.0031-9007http://nrs.harvard.edu/urn-3:HUL.InstRepos:10357490Surface-induced atomic layering in liquid gallium has been observed using x-ray reflectivity, ultrahigh vacuum conditions, and sputtered clean surfaces. Reflectivity data, collected on a supercooled liquid sample to momentum transfers as large as \(q_z\) = 3.0 Å\(^{-1}\), exhibit a strong maximum near 2.4 Å\(^{-1}\) indicating a layer spacing that is comparable to its atomic dimensions. The amplitude of the electron density oscillations decays with a characteristic length of 6 Å. This is unexpectedly twice that of recent results for Hg, and the difference may be related to covalent bonding or supercooling.en-USJournal Article2013-03-0110.1103/PhysRevLett.75.2498