Pershan, Peter2013-03-011994Pershan, Peter S. 1994. The effects of surface profile and interface correlations on X-ray reflectivity from fluid interfaces. Journal of Physics: Condensed Matter 6(23A): A37-A50.0953-8984http://nrs.harvard.edu/urn-3:HUL.InstRepos:10357531Following a brief review of the physics by which X-ray scattering can be made surface sensitive, we will discuss some details of the effects that interfacial roughness and asymmetry of interfacial profiles have on measurements of X-ray specular reflectivity. Experiments related to these effects, including study of the width and interfacial roughness of the liquid/vapour interface for \(H_{2}O\), superfluid \(^4\)He, thin wetting films of cyclohexane on Si, and metallic liquid Ga, have been reviewed elsewhere.en-USliquids and polymersinterfaces and thin filmssoft matterJournal Article10.1088/0953-8984/6/23A/005