Kawamoto, E. H.Lee, S.Pershan, PeterDeutsch, M.Maskil, N.Ocko, B. M.2013-03-011993Kawamoto, E. H., S. Lee, Peter S. Pershan, M. Deutsch, N. Maskil, and B. M. Ocko. 1993. X-ray reflectivity study of the surface of liquid gallium. Physical Review B 47(11): 6847-6850.1098-0121http://nrs.harvard.edu/urn-3:HUL.InstRepos:10357542X-ray reflectivity from the surface of liquid gallium was measured under ultrahigh vacuum conditions using a novel technique for curved surfaces. The small deviations between the measured and theoretical Fresnel reflectivity for an ideally sharp flat interface for wave-vector transfer \(\lesssim\)0.5 Å\(^{-1}\) imply an interfacial width for the electron density profile of \(\lesssim\)1.3\(\pm\)0.2 Å. This is consistent with a model of atomic close packing which lacks structure along the surface normal at length scales >10 Å.en-USJournal Article2013-03-0110.1103/PhysRevB.47.6847