Becker, R. S.Higashi, G. S.Golovchenko, Jene2016-11-181984Becker, R. S., G. S. Higashi, and J. A. Golovchenko. 1984. Low-Energy Electron Diffraction During Pulsed Laser Annealing: A Time- Resolved Surface Structural Study. Physical Review Letters 52, no. 4: 307-310. doi:10.1103/physrevlett.52.307.0031-9007http://nrs.harvard.edu/urn-3:HUL.InstRepos:29407048Nanosecond structural changes in a crystal lattice during pulsed laser annealing have been measured by use of time-resolved low-energy electron diffraction. Low-energy electron diffraction is both structure and surface (∼ 10 Å) sensitive and can yield lattice temperatures from Debye-Waller-like extinction coefficients. Combining these with nanosecond time resolution provides a surface probe for short-time dynamical processes. The results demonstrate rapid formation of a liquid layer and subsequent surface recrystallization and cooling on (111) Ge.en-USJournal Article2016-11-1810.1103/PhysRevLett.52.307