Miller, G. L.Boie, R. A.Cowan, P. L.Golovchenko, JeneKerr, R. W.Robinson, D. A. H.2016-11-181979Miller, G. L., R. A. Boie, P. L. Cowan, J. A. Golovchenko, R. W. Kerr, and D. A. H. Robinson. 1979. A Capacitance-Based Micropositioning System for x-Ray Rocking Curve Measurements. Review of Scientific Instruments 50, no, 9: 1062-1069. doi:10.1063/1.1136010.0034-6748http://nrs.harvard.edu/urn-3:HUL.InstRepos:29407060Certain types of x‐ray experiments require very precise angular positioning of crystals in the vicinity of the Bragg reflection condition. A system applicable to some measurement of this type is described which achieves a long‐term angular stability of ∼10−7 radians, coupled with a linear angular readout. This is achieved through a novel capacitance sensing system which provides angle measurement, together with the use of an auxilliary servo loop based on the Bragg condition to ensure long‐term overall angular stability.en-UScapacitanceservomechanismsJournal Article2016-11-1810.1063/1.1136010