Browsing Faculty of Arts and Sciences by Author "Axe, John D."
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The Structure of Self-Assembled Monolayers of Alkylsiloxanes on Silicon: A Comparison of Results from Ellipsometry and Low-Angle X-Ray Reflectivity
Wasserman, Stephen R.; Whitesides, George M.; Tidswell, Ian M.; Ocko, Ben M.; Pershan, Peter S.; Axe, John D. (American Chemical Society, 1989)The thicknesses of C10-C18 alkylsiloxane monolayers on silicon-silicon dioxide substrates have been measured with ellipsometry and low-angle X-ray reflection. Although, for any given sample, thicknesses measured by the two ...