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Krich, Jacob Jonathan

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Krich

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Jacob Jonathan

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Krich, Jacob Jonathan

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Now showing 1 - 2 of 2
  • Publication

    Picosecond carrier recombination dynamics in chalcogen-hyperdoped silicon

    (AIP Publishing, 2014) Sher, Meng-Ju; Simmons, Christie B.; Krich, Jacob Jonathan; Akey, Austin; Winkler, Mark T.; Recht, Daniel; Buonassisi, Tonio; Aziz, Michael; Lindenberg, Aaron M.

    Intermediate-band materials have the potential to be highly efficient solar cells and can be fabricate by incorporating ultrahigh concentrations of deep-level dopants. Direct measurements of the ultrafast carrier recombination processes under supersaturated dopant concentrations have not been previously conducted. Here, we use optical-pump/terahertz-probe measurements to study carrier recombination dynamics of chalcogen-hyperdoped silicon with sub-picosecond resolution. The recombination dynamics is described by two exponential decay time scales: a fast decay time scale ranges between 1 and 200ps followed by a slow decay on the order of 1 ns. In contrast to the prior theoretical predictions, we find that the carrier lifetime decreases with increasing dopant concentration up to and above the insulator-to-metal transition. Evaluating the material’s figure of merit reveals an optimum doping concentration for maximizing performance.

  • Publication

    Deactivation of metastable single-crystal silicon hyperdoped with sulfur

    (AIP Publishing, 2013) Simmons, C. B.; Akey, Austin; Krich, Jacob Jonathan; Sullivan, Joseph T.; Recht, Daniel; Aziz, Michael; Buonassisi, Tonio

    Silicon supersaturated with sulfur by ion implantation and pulsed laser melting exhibits broadband optical absorption of photons with energies less than silicon's band gap. However, this metastable, hyperdoped material loses its ability to absorb sub-band gap light after subsequent thermal treatment. We explore this deactivation process through optical absorption and electronic transport measurements of sulfur-hyperdoped silicon subject to anneals at a range of durations and temperatures. The deactivation process is well described by the Johnson-Mehl-Avrami-Kolmogorov framework for the diffusion-mediated transformation of a metastable supersaturated solid solution, and we find that this transformation is characterized by an apparent activation energy of (E_A=1.7 ± 0.1  eV). Using this activation energy, the evolution of the optical and electronic properties for all anneal duration-temperature combinations collapse onto distinct curves as a function of the extent of reaction. We provide a mechanistic interpretation of this deactivation based on short-range thermally activated atomic movements of the dopants to form sulfur complexes.