Publication: Effects of Thermal Roughness on X-ray Studies of Liquid Surfaces
Open/View Files
Date
2000
Authors
Published Version
Journal Title
Journal ISSN
Volume Title
Publisher
Elsevier
The Harvard community has made this article openly available. Please share how this access benefits you.
Citation
Pershan, Peter S. 2000. Effects of thermal roughness on x-ray studies of liquid surfaces. Colloids and Surfaces A 171(1-3): 149-157.
Research Data
Abstract
The effects of thermal roughness on X-ray studies of liquid surfaces will be discussed. In contrast to solid surfaces, for which the surface height–height correlation function remains finite at large distances, for liquid surfaces thermal fluctuations induce a logarithmic dependence for distances smaller than a gravitationally induced cutoff that is of the order of mm. As a result of this there is no true specular X-ray reflectivity liquid surfaces. Theory and measurements explaining this phenomena will be presented.
Description
Other Available Sources
Keywords
cutoff, liquid, x-ray
Terms of Use
This article is made available under the terms and conditions applicable to Other Posted Material (LAA), as set forth at Terms of Service