X-Ray and Optical Studies of the Thickness Dependence of the Phase Diagram of Liquid-Crystal Films

Abstract

A comprehensive study of the thickness dependence of the phase diagram of freely suspended films of the liquid crystal 4-n-heptyloxybenzylidene-4-n-heptylaniline (7O.7) between \(50 and 69^{\circ}C\) is reported. In thick films (thicker than about 300 layers and characteristic of bulk samples) there is a low-temperature crystalline-G phase followed by five crystalline-B phases with different stacking arrangements at higher temperatures. In thinner films there are two additional crystalline-B phases and two tilted hexatic phases, smectic-F and smectic-I, which do not appear in bulk samples. The in-plane and interlayer correlations in the tilted hexatic phases are anisotropic with a clear dependence on the molecular tilt direction; the in-plane correlations are more developed (longer range) perpendicular to the molecular tilt direction and the interlayer correlations are more developed parallel to the tilt direction.