Publication: Liquid-Vapor Density Profile of Helium: An X-Ray Study
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Date
1992
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American Physical Society
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Lurio, L. B., T. A. Rabedeau, Peter S. Pershan, Isaac F. Silvera, M. Deutsch, S. D. Kosowsky, and B. M. Ocko. 1992. Liquid-vapor density profile of helium: An x-ray study. Physical Review Letters 68(17): 2628-2631.
Abstract
The average liquid-vapor density profiles 〈ρ(z)〉 of thick (^4)He films adsorbed onto a silicon substrate were measured using x-ray reflectivity. The results are well represented by a 90%-10% interfacial width of 9.2(\pm)1 Å at 1.13 K which extrapolates to a T=0 K, 90%-10% interfacial width of 7.6(\pm^{1}_{2}) Å. The sensitivity of the measurement to the width, shape, and asymmetry of the density profile is discussed.
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