Publication: The Effects of Surface Profile and Interface Correlations on X-Ray Reflectivity from Fluid Interfaces
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Date
1994
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Institute of Physics
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Pershan, Peter S. 1994. The effects of surface profile and interface correlations on X-ray reflectivity from fluid interfaces. Journal of Physics: Condensed Matter 6(23A): A37-A50.
Abstract
Following a brief review of the physics by which X-ray scattering can be made surface sensitive, we will discuss some details of the effects that interfacial roughness and asymmetry of interfacial profiles have on measurements of X-ray specular reflectivity. Experiments related to these effects, including study of the width and interfacial roughness of the liquid/vapour interface for (H_{2}O), superfluid (^4)He, thin wetting films of cyclohexane on Si, and metallic liquid Ga, have been reviewed elsewhere.
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liquids and polymers, interfaces and thin films, soft matter
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