Publication:

Interplay of Cavity Thickness and Metal Absorption in Thin-film InGaN Photonic Crystal Light-emitting Diodes

Loading...
Thumbnail Image

Date

2010

Published Version

Journal Title

Journal ISSN

Volume Title

Publisher

American Institute of Physics
The Harvard community has made this article openly available. Please share how this access benefits you.

Research Projects

Organizational Units

Journal Issue

Citation

Rangel, Elizabeth, Elison Matioli, Hung-Tse Chen, Yong-Seok Choi, Claude Weisbuch, James S. Speck, and Evelyn L. Hu. 2010. Interplay of cavity thickness and metal absorption in thin-film InGaN photonic crystal light-emitting diodes. Applied Physics Letters 97, no. 6: 061118.

Abstract

Thin-film InGaN photonic crystal (PhC) light-emitting diodes (LEDs) with a total semiconductor thickness of either 800 nm or 3.45 μm were fabricated and characterized. Increased directional radiance relative to Lambertian emission was observed for both cases. The 800-nm-thick PhC LEDs yielded only a slight improvement in total light output over the 3.45-μm-thick PhC LEDs. Simulations indicate that, except for ultrathin devices well below 800 nm, the balance between PhC extraction and metal absorption at the backside mirror results in modal extraction efficiencies that are almost independent of device thickness, but highly dependent on mirror reflectivity.

Description

Other Available Sources

Research Data

Keywords

Terms of Use

This article is made available under the terms and conditions applicable to Other Posted Material (LAA), as set forth at Terms of Service

Endorsement

Review

Supplemented By

Related Stories