Publication:

Locally testable codes and cayley graphs

Loading...
Thumbnail Image

Date

2014

Published Version

Journal Title

Journal ISSN

Volume Title

Publisher

ACM Press
The Harvard community has made this article openly available. Please share how this access benefits you.

Research Projects

Organizational Units

Journal Issue

Citation

Gopalan, Parikshit, Salil Vadhan, and Yuan Zhou. 2014. “Locally Testable Codes and Cayley Graphs.” In Proceedings of the 5th Conference on Innovations in Theoretical Computer Science (ITCS’14), 12-14 January, 2014, Princeton, NJ, 81-92. New York, NY: ACM Press. doi:10.1145/2554797.2554807.

Abstract

We give two new characterizations of ( 2-linear, smooth) locally testable error-correcting codes in terms of Cayley graphs over Fh2: * A locally testable code is equivalent to a Cayley graph over h2 whose set of generators is significantly larger than h and has no short linear dependencies, bbut yields a shortest-path metric that embeds into l with constant distortion. This extends and gives a converse to a result of Khot and Naor (2006), which showed that codes with large dual distance imply Cayley graphs that have no low-distortion embeddings into l . * A locally testable code is equivalent to a Cayley graph over Fh2 that has significantly more than h eigenvalues near 1, which have no short linear dependencies among them and which "explain" all of the large eigenvalues. This extends and gives a converse to a recent construction of Barak et al. (2012), which showed that locally testable codes imply Cayley graphs that are small-set expanders but have many large eigenvalues.

Description

Other Available Sources

Research Data

Keywords

Terms of Use

This article is made available under the terms and conditions applicable to Open Access Policy Articles (OAP), as set forth at Terms of Service

Endorsement

Review

Supplemented By

Related Stories