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  4. Diffusion, Deformation, and Damage in Lithium-Ion Batteries and Microelectronics

Diffusion, Deformation, and Damage in Lithium-Ion Batteries and Microelectronics

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PharrV_gsas.harvard_0084L_11593.pdf (3.08 MB)
Date
June 6, 2014
Author(s)
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Citation
Pharr, Matt Mathews. 2014. Diffusion, Deformation, and Damage in Lithium-Ion Batteries and Microelectronics. Doctoral dissertation, Harvard University.
Abstract
This thesis explores mechanical behavior of microelectronic devices and lithium-ion batteries. We first examine electromigration-induced void formation in solder bumps by constructing a theory that couples electromigration and creep. The theory can predict the critical current density below which voids do not form. Due to the effects of creep, this quantity is found to be independent of the solder size and decrease exponentially with increasing temperature, different from existing theories.
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This article is made available under the terms and conditions applicable to Other Posted Material (LAA), as set forth at Terms of Service
URI
http://nrs.harvard.edu/urn-3:HUL.InstRepos:12271804
Subjects

Engineering

Mechanics

Materials Science

Fracture

Kinetics

Lithium-ion batteries...

Microelectronics

Plasticity

Solders

Collection
FAS Theses and Dissertations
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