Publication: New Applications of X-Ray Standing-Wave Fields to Solid State Physics
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Date
1976
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American Physical Society (APS)
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Andersen, S. Kjaer, J. A. Golovchenko, and G. Mair. 1976. New Applications of X-Ray Standing-Wave Fields to Solid State Physics. Physical Review Letters 37, no. 17: 1141-1145. doi:10.1103/physrevlett.37.1141.
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Abstract
An x-ray standing-wave-field apparatus has been constructed that demonstrates an impurity atomic position resolution of ∼0.02 Å. The method is applied to the measurement of ion-implantation-induced lattice relaxation. It is pointed out that the method is also suited to determine surface impurity locations perpendicular to crystal surfaces.
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