Publication: Low-Energy Electron Diffraction during Pulsed Laser Annealing: A Time- Resolved Surface Structural Study
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Date
1984
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American Physical Society (APS)
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Becker, R. S., G. S. Higashi, and J. A. Golovchenko. 1984. Low-Energy Electron Diffraction During Pulsed Laser Annealing: A Time- Resolved Surface Structural Study. Physical Review Letters 52, no. 4: 307-310. doi:10.1103/physrevlett.52.307.
Abstract
Nanosecond structural changes in a crystal lattice during pulsed laser annealing have been measured by use of time-resolved low-energy electron diffraction. Low-energy electron diffraction is both structure and surface (∼ 10 Å) sensitive and can yield lattice temperatures from Debye-Waller-like extinction coefficients. Combining these with nanosecond time resolution provides a surface probe for short-time dynamical processes. The results demonstrate rapid formation of a liquid layer and subsequent surface recrystallization and cooling on (111) Ge.
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