Publication:
Finite-temperature molecular-dynamics study of unstable stacking fault free energies in silicon

No Thumbnail Available

Date

1998

Journal Title

Journal ISSN

Volume Title

Publisher

American Physical Society
The Harvard community has made this article openly available. Please share how this access benefits you.

Research Projects

Organizational Units

Journal Issue

Citation

Koning, M. de, A. Antonelli, Martin Z. Bazant, Efthimios Kaxiras, and J. F. Justo. 1998. “Finite-Temperature Molecular-Dynamics Study of Unstable Stacking Fault Free Energies in Silicon.” Physical Review B 58 (19): 12555–58. https://doi.org/10.1103/physrevb.58.12555.

Research Data

Abstract

We calculate the free energies of unstable stacking fault (USF) configurations on the glide and shuffle slip planes in silicon as a function of temperature, using the recently developed environment-dependent interatomic potential (EDIP). We employ the molecular dynamics (MD) adiabatic switching method with appropriate periodic boundary conditions and restrictions to atomic motion that guarantee stability and include volume relaxation of the USF configurations perpendicular to the slip plane. Our MD results using the EDIP model agree fairly well with earlier first-principles estimates for the transition from shuffle to glide plane dominance as a function of temperature. We use these results to make contact to brittle-ductile transition models. [S0163-1829(98)06043-3].

Description

Other Available Sources

Keywords

Terms of Use

This article is made available under the terms and conditions applicable to Other Posted Material (LAA), as set forth at Terms of Service

Endorsement

Review

Supplemented By

Referenced By

Related Stories