Person:

Kanev, Svilen

Parameter variations have become a dominant challenge in microprocessor design. Voltage variation is especially daunting because it happens so rapidly. We measure and characterize voltage variation in a running Intel Core2 Duo processor. By sensing on-die voltage as the processor runs single-threaded, multi-threaded, and multi-program workloads, we determine the average supply voltage swing of the processor to be only 4 percent, far from the processor's 14percent worst-case operating voltage margin. While such large margins guarantee correctness, they penalize performance and power efficiency. We investigate and quantify the benefits of designing a processor for typical-case (rather than worst-case) voltage swings, assuming that a fail-safe mechanism protects it from infrequently occurring large voltage fluctuations. With today's processors, such resilient designs could yield 15 percent to 20 percent performance improvements. But we also show that in future systems, these gains could be lost as increasing voltage swings intensify the frequency of fail-safe recoveries. After characterizing micro architectural activity that leads to voltage swings within multi-core systems, we show that a voltage-noise-aware thread scheduler in software can co-schedule phases of different programs to mitigate error recovery overheads in future resilient processor designs.

Voltage variations are a major challenge in processor design. Here, researchers characterize the voltage noise characteristics of programs as they run to completion on a production Core 2 Duo processor. Furthermore, they characterize the implications of resilient architecture design for voltage variation in future systems.

Simulation is one of the main vehicles of computer architecture research. In this paper, we present XIOSim - a highly detailed microarchitectural simulator targeted at mobile x86 microprocessors. The simulator execution model that we propose is a blend between traditional user-level simulation and full-system simulation. Our current implementation features detailed power and performance core models which allow microarchitectural exploration. Using a novel validation methodology, we show that XIOSim's performance models manage to stay well within 10% of real hardware for the whole SPEC CPU2006 suite. Furthermore, we validate power models against measured data to show a deviation of less than 5% in terms of average power consumption.

In this paper, we characterize the impact of compiler optimizations on voltage noise. While intuition may suggest that the better processor utilization ensured by optimizing compilers results in a small amount of voltage variation, our measurements on a Intel® Core™2 Due Processor show the opposite - the majority of SPEC 2006 benchmarks exhibit more voltage droops when aggressively optimized. We show that this increase in noise could be sufficient for a net performance decrease in a typical case, resilient design.