Publication: Voltage Noise in Production Processors
Date
2011
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Institute of Electrical & Electronics Engineers (IEEE)
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Janapa Reddi, Vijay, Svilen Kanev, Wonyoung Kim, Simone Campanoni, Michael D. Smith, Gu-Yeon Wei, and David Brooks. 2011. “Voltage Noise in Production Processors.” IEEE Micro 31 (1) (January): 20–28. doi:10.1109/mm.2010.104.
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Abstract
Voltage variations are a major challenge in processor design. Here, researchers characterize the voltage noise characteristics of programs as they run to completion on a production Core 2 Duo processor. Furthermore, they characterize the implications of resilient architecture design for voltage variation in future systems.
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