Person: Spaepen, Frans
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Publication A second report on tilt boundaries in hard sphere F.C.C. crystals
(Elsevier BV, 1982) Frost, Hildreth Robert; Spaepen, Frans; Ashby, MatthewPublication A catalogue of [100], [110], and [111] symmetric tilt boundaries in face-centered cubic hard sphere crystals.
(Harvard Division of Applied Sciences, 1982) Frost, H.J.; Ashby, M.F.; Spaepen, FransPublication Partitionless crystallization and glass formation in Fe-B alloys during picosecond pulsed laser quenching
(1984) Spaepen, Frans; Lin, Chien-JungPublication Structural Relaxation of Amorphous (Pd_{82}Si_{18}): X-Ray Measurements, Electrical-Resistivity Measurements, and a Comparison Using the Ziman Theory
(American Physical Society, 1985) Chason, E.; Greer, A. L.; Kelton, K. F.; Pershan, Peter; Sorensen, L. B.; Spaepen, Frans; Weiss, A. H.Structural relaxation in amorphous (Pd_{82}Si_{18}) is studied using high-precision x-ray diffraction. The x-ray structure factor S(k) and the density ρ (determined from the x-ray absorption), are measured simultaneously as a function of the annealing conditions. The measured changes in S(k) are compared with those expected from simple densification using a Percus-Yevick model with two hard-sphere diameters. The variation in the electrical resistivity with annealing is also measured and is compared with the resistivity change estimated from the x-ray measurements using the Ziman theory. To allow a direct comparison of the x-ray and electrical measurements, we derive an approximate relationship between the x-ray atomic scattering factor and the pseudopotential as a substitute for a first-principles calculation. The combination of the low scattering rate from the amorphous samples and the high precision (<0.1%) necessary to allow direct comparison requires special techniques to maintain adequate system stability.