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Enhanced metrology using preferential orientation of nitrogen-vacancy centers in diamond

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2012

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American Physical Society (APS)
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Pham, L. M., N. Bar-Gill, D. Le Sage, C. Belthangady, A. Stacey, M. Markham, D. J. Twitchen, M. D. Lukin, and R. L. Walsworth. 2012. “Enhanced Metrology Using Preferential Orientation of Nitrogen-Vacancy Centers in Diamond.” Phys. Rev. B 86 (12) (September): 121202(R)

Abstract

We demonstrate preferential orientation of nitrogen-vacancy (NV) color centers along two of four possible crystallographic axes in diamonds grown by chemical vapor deposition on the {100} face. We identify the relevant growth regime and present a possible explanation of this effect. We show that preferential orientation provides increased optical readout contrast for NV multispin measurements, including enhanced ac magnetic-field sensitivity, thus providing an important step towards high-fidelity multispin-qubit quantum information processing, sensing, and metrology.

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