Raman Characterization and Polarity Tuning of Aligned Single-Walled Carbon Nanotubes on Quartz

Abstract

Raman characterization has been employed to study key features of highly aligned single-walled carbon nanotubes grown on quartz substrates. The nanotubes are observed to possess an estimated metallic/semiconducting ratio of 1:2.7, and Raman spectra also confirm the high integrity of nanotubes before and after being transferred from quartz to Si/SiO2 substrates. Based on the as-grown and the transferred aligned nanotubes, we have further fabricated top- and back-gated nanotube devices, respectively. The top-gated transistors exhibit ambipolar transport characteristics with high transconductance, small subthreshold swing of 110 mV/decade and on/off ratio of 107, while the back-gated transistors show unipolar p-type characteristics. Furthermore, we have demonstrated polarity tuning to produce both predominately n- and p-type top-gated carbon nanotube transistors by controlling the polarity of gate voltage during electrical breakdown, which has great potential for building complementary carbon nanotube circuits.