Person: Chervinsky, John
Email Address
AA Acceptance Date
Birth Date
Research Projects
Organizational Units
Job Title
Last Name
First Name
Name
Search Results
Publication Comment on “Low-temperature homoepitaxial growth on high-miscut Si(111) mediated by thin overlayers of Pb” [Appl. Phys. Lett. 75, 2954 (1999)]
(AIP Publishing, 2000) Evans, P. G.; Dubon, O. D.; Chervinsky, John; Spaepen, Frans; Golovchenko, JenePublication Low-temperature homoepitaxial growth on Si(111) through a Pb monolayer
(AIP Publishing, 1998) Evans, P. G.; Dubon, O. D.; Chervinsky, John; Spaepen, F.; Golovchenko, JeneA monolayer of Pb mediates high-quality homoepitaxialgrowth on Si (111) surfaces at temperatures where growth with other overlayer elements or on bare surfaces leads to amorphous or highly defective crystalline films. Nearly defect-free epitaxy proceeds for film thicknesses up to 1000 Å with no sign that this is an upper limit. The minimum temperature for high-quality epitaxy depends on the substrate miscut. For a 0.2° miscut, the minimum temperature is 340 °C. Filmsgrown on substrates miscut 2.3° towards [112̄] show good crystalline quality down to 310 °C.