| dc.contributor.author | Weyrich, Tim | |
| dc.contributor.author | Matusik, Wojciech | |
| dc.contributor.author | Pfister, Hanspeter | |
| dc.contributor.author | Ngan, Addy | |
| dc.contributor.author | Gross, Markus | |
| dc.date.accessioned | 2011-02-15T20:45:09Z | |
| dc.date.issued | 2005 | |
| dc.identifier.citation | Weyrich, Tim, Wojciech Matusik, Hanspeter Pfister, Addy Ngan, and Markus Gross. 2005. Measuring skin reflectance and subsurface scattering. MERL Technical Report TR2005-046. | en_US |
| dc.identifier.uri | http://nrs.harvard.edu/urn-3:HUL.InstRepos:4726190 | |
| dc.description.abstract | It is well known that human facial skin has complex reflectance properties that are difficult to model, render, and edit. We built two measurement devices to analyze and reconstruct the reflectance properties of facial skin. One device is a dome-structured face scanning system equipped with 16 cameras and 150 point light sources that is used to acquire BRDF samples of a face. The other device is a touch-based HDR imaging system to measure subsurface scattering properties of the face. In this technical report we describe how these devices are constructed, calibrated, and used to acquire high-quality reflectance data of human faces. | en_US |
| dc.description.sponsorship | Engineering and Applied Sciences | en_US |
| dc.language.iso | en_US | en_US |
| dc.publisher | Mitsubishi Electric Research Laboratories | en_US |
| dc.relation.isversionof | http://www.merl.com/publications/TR2005-046/ | en_US |
| dc.relation.hasversion | http://gvi.seas.harvard.edu/sites/all/files/skin%20reflectance.pdf | en_US |
| dash.license | META_ONLY | |
| dc.title | Measuring Skin Reflectance and Subsurface Scattering | en_US |
| dc.type | Research Paper or Report | en_US |
| dc.description.version | Version of Record | en_US |
| dc.relation.journal | MERL Technical Report | en_US |
| dash.depositing.author | Pfister, Hanspeter | |
| dash.embargo.until | 10000-01-01 | |
| dash.contributor.affiliated | Pfister, Hanspeter | |
